J Korean Acad Conserv Dent.  2011 Mar;36(2):119-124. 10.5395/JKACD.2011.36.2.119.

The evaluation of surface roughness and polishing time between polishing systems

Affiliations
  • 1Department of Dentistry, Ewha Woman's University Mokdong Hospital, Seoul, Korea.
  • 2Department of Conservative Dentistry, Gangnam Severance Hospital, Yonsei University College of Dentistry, Seoul, Korea. pjw@yuhs.ac

Abstract


OBJECTIVES
The purpose of this experiment was to evaluate four different polishing systems of their polishability and polishing time.
MATERIALS AND METHODS
4 mm diameter and 2 mm thickness Teflon mold was made. Z-250 (3M ESPE) hybrid composite resin was slightly overfilled and pressed with slide glass and cured with Optilux 501 for 40 sec each side. Then the surface roughness (glass pressed: control group) was measured with profilometer. One surface of the specimen was roughened by #320 grit sand paper and polished with one of the following polishing systems; Sof-Lex (3M ESPE), Jiffy (Ultradent), Enhance (Dentsply/Caulk), or Pogo (Dentsply/Caulk). The surface roughness and the total polishing time were measured. The results were analyzed with one-way ANOVA and Duncan's multiple range test.
RESULTS
The surface roughness was lowest in Pogo, and highest in Sof-Lex. Polishing times were shortest with Pogo, and followed by the Sof-Lex, Enhance and Jiffy.
CONCLUSIONS
One-step polishing system (Pogo) is very effective to get the smooth surface in a short time, therefore it can be recommended for final polishing system of the restoration.

Keyword

Dental composite; One-step polishing; Polishing; Surface roughness

MeSH Terms

Chimera
Fungi
Glass
Polytetrafluoroethylene
Silicon Dioxide
Polytetrafluoroethylene
Silicon Dioxide

Figure

  • Figure 1 Surface roughness (Ra, µm) of composite resins with 4 different polishing systems.

  • Figure 2 Polishing time (seconds) of 4 different polishing systems.

  • Figure 3 SEM image of the polished composite surface with each polishing system (left ×100, right ×10,000). SEM, scanning electron microscopr.


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