J Korean Ophthalmol Soc.
2002 Feb;43(2):363-368.
Scanning Electron Microscopic Findings of Removed Supramid Extra II(R) from Recurred Congenital Ptosis Patients
- Affiliations
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- 1Department of Ophthalmology, Yonsei University College of Medicine, Seoul, Korea. sylee1009@yumc.yonsei.ac.kr
- 2The Institute of Vision Research, Yonsei University College of Medicine, Seoul, Korea.
- 3Department of Ophthalmology, Ajou University School of Medicine, Suwon, Korea.
Abstract
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PURPOSE: To identify the cause of frequent recurrence of ptosis after frontalis suspension with Supramid Extra II(R), we investigated the change occurring in the Supramid following implantation.
METHODS
We examined the removed Supramid Extra II(R) from recurred congenital ptosis by scanning electron microscopy.
RESULTS
Some cracks were noted on its sheath as well as hydrolytic remnant of internal polyfilament. In most cases, the longer the implantation time was, the more the sign of disintegration was observed.
CONCLUSIONS
This study showed that hydrolysis and subsequent weakening of Supramid material might have caused the frequent recurrence of ptosis.
